Hisomet microscope system offers a Precise Focus Indicator consisting of an index graticule (Target Mark) and a beam splitting prism built into reflecting illumination optical system of microscore. And it has been designed based on the optical principle that at just ficus status, of which the upper and lower halves coincide, can be observed above the focused image of a specimen, and that when defocused even slightly, the index line is split into two lines in the upper and lower halves of the graticule.

Method of measurement
An exact focal point is secured by confirming that the vertical index lines in the upper and lower halves of the graticule coincide with both of straight lines exactly, rather than by making judgements as to whether image of a specimen surface is blurred or not.
Since this is a unique system that is neither affected by the focal depth of objective lenses nor dependent on the ability of the human eyes to discriminate two points, a focal point can be determined very accurately as compared with other focusing systems. This focusing system and the digital gauge allow non-contact, high precision measurements of step heights between surfaces.

Advantages

• As a focal point is detected under the non-contact optical method, measurements can be taken without being affected by physical damages to a specimen such as distortion, blow or nicks, etc. (Refer to Diagram -1)
• Since the precise focus indicator based on the "split-target" method has been adopted, highly-accurate depth measurements can be taken simply by coinciding the two halves of the graticule.
• As the operation is so simple, this is the most suitable measuring microscope system for various kinds of applications.
• While observing minute surface condition of a point of measurement, the positional relation between a reference point of measurement and a point of measurement can be confirmed, and measurements can be also taken in the same fild of view. (Refer to Diagram -2)
• Measurement accuracy can be improved through the use of high magnification objective lenses, (Refer to Diagram-3)
• Either Black-stripe or White-stripe Target Mark can be chosen as per a condition of specimen surface. Since three kinds of Target Mark status (black-stripe, while-stripe and nothing) can be selected by a lever, the photographs can be taken without the Target Mark if necessary.
• Various models can be configured by the combination of different equipment such as viewing head, measuring stage and other optional items, depending on applications of respective users. (Refer to System Diagram)
• In case of observing transparent, mirror or pearskin finish surfaces with a laser system, focus errors are apt to occur due to diffuse reflection. While, Target Mark can be projected onto such surfaces in case of our optical system, step heights of such specimen surfaces can be measured.

Name	:	AccuLinks Systems (M) Sdn Bhd (742506-V)
Business Type	:	Measuring Equipment & Supplies
Main Product	:	optical microscope, profile projector, VMM, CMM, Portable CMM, video CMM, salt spray, tensile tester, hardness tester, XRF Elemental Analyzer, Oven, Temperature and Humidity Test Chamber, etc.
Year Established	:	2006
Location	:	Shah Alam, Penang, Malacca
Website	:	http://www.acculinks.com

• Inspection, Measuring & Testing Equipment

  CNC Fully Automatic Video Measuring Machine

  
• Inspection, Measuring & Testing Equipment

  Manual Rockwell Hardness Tester

  
• Inspection, Measuring & Testing Equipment

  Automatic Rockwell Hardness Tester

  
• Inspection, Measuring & Testing Equipment

  CNC Fully Automatic Video Measuring Machine